@bohrok2610,
Thank you for these measurements.
It seems to confirm what I had speculated about (for ESS DACs) that this typical error patterns we see are result of glitch energy wandering around when the converter excercises more than one of the 64 current cell segments (the thermometer-coded 6 bit final output current sources).
1/4th the final converter speed ==> 1/4th of glitch energy per time unit ==> 12dB lower levels in spectrum, theoretically. And higher noise. In DSD mode I saw the noise also goes up and the hash seems to go down as well.
Someone has said here(?) that an ESS I/V stage is best realized with a passive filter in its first stage to fully isolate the OpAmp wrt RF glitch energy. I would fully agree (and I'm working on that front, too, also adding shunt caps -- to rails and between +ive and -ive chip output pins). Remaining errors from the glitching should be then down to the base level the chip is really capable of. Which might even be improved by playing with the output pin node voltage (as set by the I/V) and other fine tuning, besides HD2/3 compensation, stiff Vref etc.
In extreme cases the glitch energy corrupts the output to the point that the "ESS hump" is really sticking out in the typical THD+N or IMD vs level plots.
See my investigation here:
https://www.audiosciencereview.com/...-hump-revisited-khadas-tone-board-v1-3.30136/
However, for the ESS ADCs not that many options, except lowering the clock. Lowering levels helps for both DAC and ADC but is awkward, of course, with < FS/64 as the target.