|28th October 2003, 05:26 AM||#11|
Join Date: Sep 2003
Location: Long Island
I have been discussing this method as a means of measuring the hf phase (temporal) errors in an output stage as a result of reactive loading.
My concern was the transient chip dissipation and the thermal tracking output bias set inability to follow chip level thermals, as they are 100 uSec to 10 msec in nature, while the bias tracking is tens of seconds.
I was interested in transient response shifts as they pertain to soundstage, that being the 20 microsecond shift range.
Guess I'll look that one up..
Thanks for the reference.
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