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Old 8th December 2010, 04:04 PM   #31
frags is offline frags  Canada
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Quote:
Originally Posted by Bksabath View Post
Please tel me more
Al
I'll draw a schematic tonight and upload it with more details.
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Old 8th December 2010, 04:10 PM   #32
AndrewT is offline AndrewT  Scotland
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Quote:
Originally Posted by Zen Mod View Post
- you can make differential tester - with one mosfet as "etalon" one and another as DUT, but you need controlled temperature for both etalon and DUT
Quote:
There's another way of matching FETs if you have two matched resistors (0.1% or better).
In this case voltage regulation and FET temperatures are not a problem at all.
Using this method you will match two FETs connected at the same time with same conditions.
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Originally Posted by Bksabath View Post
this sound very good
Please tel me more
differential test, compare DUT to REF.
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Old 8th December 2010, 04:20 PM   #33
frags is offline frags  Canada
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Originally Posted by AndrewT View Post
differential test, compare DUT to REF.
Exactly, and, if you place both of them at the same heat sink with the same thermal pads close enough, the temperature drift will now be an issue.
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Old 8th December 2010, 04:26 PM   #34
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You have to do a lot of testing to assure perfect matching, and
this is not usually practical. That's why there are ballast
resistors on the Source pins - to improve the equality of
behavior.

For Mosfets I simply test Vgs under typical idle conditions
and use parts from the same lot code. In actual output
stages with lots of parallel devices this works fine.

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Old 8th December 2010, 05:10 PM   #35
frags is offline frags  Canada
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Nelson, you are 100% right.
When I bought 20 IRFP240s from mouser I got maximum Vgs difference 6mV at 1-1.5A Iq.
It means that the transistors manufactured under same conditions (some equipment, timestamp, etc) are very very close to each other and do not require an extra effort to match them.

Last edited by frags; 8th December 2010 at 05:13 PM.
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Old 8th December 2010, 05:23 PM   #36
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Quote:
Originally Posted by Nelson Pass View Post
You have to do a lot of testing to assure perfect matching, and
this is not usually practical. That's why there are ballast
resistors on the Source pins - to improve the equality of
behavior.

For Mosfets I simply test Vgs under typical idle conditions
and use parts from the same lot code. In actual output
stages with lots of parallel devices this works fine.


For a conventional amp i agree but what about matching for rail switches where there are no source/drain resistors?
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Old 8th December 2010, 05:37 PM   #37
frags is offline frags  Canada
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Originally Posted by Zero Cool View Post
For a conventional amp i agree but what about matching for rail switches where there are no source/drain resistors?
For this it does not matter at all. Not big deal if one FET has ON resistance 18mOhm and another 19mOhm.
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Old 9th December 2010, 03:33 AM   #38
frags is offline frags  Canada
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Bksabath,
Here is the schematic for differential FET testing
Click the image to open in full size.
You need to measure the voltage difference between FET drains which should be zero in case of two absolutely equal FETs.
With the potentiometer you can set desire current via FETs.
R5 and D1 for FET gate protection and can be omitted.
Temperature drift will equally affect both FETs if are they mounted at the same heat sink.
Again, you need to match R1 and R2 as close as you can.

Last edited by frags; 9th December 2010 at 03:42 AM.
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Old 9th December 2010, 09:49 AM   #39
AndrewT is offline AndrewT  Scotland
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Frags,
I can't open your link, not even in a new window.
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Old 9th December 2010, 01:36 PM   #40
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Hi Frags

Sorry Mate
The link does not work

Al
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