matching 2N4401

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Hi all

I'm in the process of matching 8 x 2N4401s for an MC input stage I'd like to try out. These 4401s will be in parallel.

The questions are:

1. how closely matched do they have to be
2. if not closely matched I have read somewhere that putting a 1ohm resistor on the emitters will negate ultra close matching.

Any advice or small pictures would be helpful on this one.

rgards Rob
 
Hi all

I'm in the process of matching 8 x 2N4401s for an MC input stage I'd like to try out. These 4401s will be in parallel.

The questions are:

1. how closely matched do they have to be
2. if not closely matched I have read somewhere that putting a 1ohm resistor on the emitters will negate ultra close matching.

Any advice or small pictures would be helpful on this one.

rgards Rob

18mV will cause ~2:1 (.0259*ln(2)Volts) current hogging, 1 Ohm won't help much in an input stage since you need 50mV or so drop to do much of anything (50mA per device).

.0259*ln(how-good-you-want-the-current-shared) is the Vbe match you want. You need to be very careful not to heat them up with your fingers while matching them, only a couple of degrees C will obviate the exercise.
 
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Hi Scott

Thank you for the reply.
That went right over my head!

In lay-mans terms please. I'm using 4 devices per channel but maybe 8 devices per if I feel brave. Why 50mV or 50mA per device? What is 0.0259* In ??

thanks
 
Hi Scott

Thank you for the reply.
That went right over my head!

In lay-mans terms please. I'm using 4 devices per channel but maybe 8 devices per if I feel brave. Why 50mV or 50mA per device? What is 0.0259* In ??

thanks

OK, the short story is that 1 Ohm won't help. If you connect the transistor like a diode (collector shorted to base) and run say 1mA through it the Vbe's should match to better than 5-10mV.

25.9mV is the thermal voltage, every doubling of current is about 18mV change in Vbe so the relationship is logarithmic. .0259*ln(2) =~ .018

A fresh 9V battery, 6.8k resistor, a three pin socket, and a DVM should be all you need (use pliers to change parts, the Vbe changes rapidly with temperature).
 
Note, that where devices are in parallel, the important parameter that benefits from matching, is Vbe, not hFE.

The hFE mismatch would make a microscopic contribution in the case of diode connected transistors probably less than 1% (250uV delta Vbe). You could probably use the diode check feature of a handheld DVM and get close enough, I think they are around 100uA test current.
 
Or, if you can use matched pairs consider using the MMDT4401 in a 6 lead package. There are quads in a single package if you can use 2n2222, 2n3904 or my favorite, MAT14 from AD. MAT14 are very well matched 40V, 30 ma devices.
 
Or, if you can use matched pairs consider using the MMDT4401 in a 6 lead package. There are quads in a single package if you can use 2n2222, 2n3904 or my favorite, MAT14 from AD. MAT14 are very well matched 40V, 30 ma devices.

I don't as a rule push our parts, but I agree paralleling the 4 in the MAT14 would be a good choice, Avnet has the lowest price I think right now still a little pricey. You could check THAT Corp. and see if they have an equivalent.
 
20mVbe is a big difference.
Set up a pair that far apart.
Link them like an LTP with the bases connected together.
Measure the collector currents. They will be massively different.
When you find a pair that have very close collector currents then Vce and Pq and Tc and Tj and Vbe are all the same. Now you have a pair @ at that one collector current.
Now try to find pairs that match over a range of currents.
Then the big one, find triplets and/or quads.
 
Well I've just tested 8 x 2n4401s with my DCA55 transistor tester. The VBE measurements were 0.70v to 0.72v. across all 8 transistors. And that was from me just picking out the first 8. Seems like a good batch 🙂

When you parallel two with ~20mV offset one will be about 2/3 of the total current and the other 1/3. If the total distribution is 20mV It should be easy to group them by +-5mV bins which should be good enough to benefit from paralleling.
 
Vbe matching

Ian Fritz' pdf describes beautifully the DUT and REF comparison method.

I use this LTP comparison method all the time. I believe it is the only way I and similarly resource restricted amateurs can achieve accuracy.

Ian locates his measuring resistors in the emitters rather than the collectors where I place them. So I have copied the pdf to my reference files.
I shall use his exact method on my next batch to see how it compares with mine.

As a further development.
The measuring resistors stay in the Fritz location but they are loaded with a switchable CCS connected to the -ve rail (for the NPN testing, for PNP the CCS is swapped to the +ve rail as Fritz shows in the alternative diagram).

This allows measurement of the "Vbe diff" at a range of fixed currents. Maybe switchable from 100uA to 20mA in E3 steps (1 2 5 10) just 8 positions for that 200:1 current range to suit many lower current devices. 0.1" sil pins with a 0.1" shorting plug allow quick and repeatable switching.
A "big" version could be built up for 20mA to 500mA measuring of Power devices.
 
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